Research methods - X-ray scattering

X-ray diffraction is the standard method for determination of crystal structures.

X-ray diffraction is the standard method for determination on crystal structures. Information on lattice imperfections can in some cases also be obtained by fitting the experimental data to suitable models.

The sample is mounted in the center of a goniometer, whose two arms can be moved in a precisely controlled manner. On each of the arms there is a X-ray source and an X-ray detector which measures the scatteredintensity at discrete angles. In another type of setup the scattered intensity is measured over a large angular interval by a detector (e.g.a photographic film) that accepts a wide range of angles.

In the specialized equipment at Materials Physics the samples can be exposed to controlled hydrogen pressure. Crystallographic changes (rearrangements, phase transitions) can be followed on-line at different selected pressures and temperatures in the interval 10 -800 K during hydrogen uptake, even for nano-sized layers (> 50 Å).

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