Research methods - Atomic probes

Scanning probe microscopy where a sharp tip is scanned across a surface provides unique information about features on the scale of nanometres.

 

AFM-MFM-STM

Instruments for atomic force microscopy are being set up both for use both under ambient conditions and for studies in-situ in the growth systems. These microscopes are ideal for investigation of patterned materials and nanoparticles.

 

 

 

 

 

The figure illustrates 800 nm wide and 10 nm high Pd/Fe/Pd thin film dots fabricated using electron lithography.

 

 

 

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